Scaling laws for the critical rupture thickness of common thin films
Article
Article Title | Scaling laws for the critical rupture thickness of common thin films |
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ERA Journal ID | 1428 |
Article Category | Article |
Authors | Coons, J. E. (Author), Halley, P. J. (Author), McGlashan, S. A. (Author) and Tran-Cong, T. (Author) |
Journal Title | Colloids and Surfaces A: Physicochemical and Engineering Aspects |
Journal Citation | 263 (1-3), pp. 258-266 |
Number of Pages | 9 |
Year | 2005 |
Place of Publication | Netherlands |
ISSN | 0927-7757 |
1873-4359 | |
Digital Object Identifier (DOI) | https://doi.org/10.1016/j.colsurfa.2005.01.008 |
Web Address (URL) | https://www.sciencedirect.com/science/article/pii/S0927775705000725 |
Abstract | [Abstract]: Despite decades of experimental and theoretical investigation on thin films, considerable uncertainty exists in the prediction of their critical rupture thickness. According to the spontaneous rupture mechanism, common thin films become unstable when capillary waves at the interfaces begin to grow. In a horizontal film with symmetry at the midplane, unstable waves from adjacent interfaces grow towards the center of the film. As the film drains and becomes thinner, unstable waves osculate and cause the film to rupture. Uncertainty stems from a number of sources including the theories used to predict film drainage and corrugation growth dynamics. In the early studies, the linear stability of small amplitude waves was investigated in the context of the quasi-static approximation in which the dynamics of wave growth and film thinning are separated. The zeroth order wave growth equation of Vrij predicts faster wave growth rates than the first order equation derived by Sharma and Ruckenstein. It has been demonstrated in an accompanying paper that film drainage rates and times measured by numerous investigations are bounded by the predictions of the Reynolds equation and the more recent theory of Manev, Tsekov, and Radoev. Solutions to combinations of these equations yield simple scaling laws which should bound the critical rupture thickness of foam and emulsion films. In this paper, critical thickness measurements reported in the literature are compared to predictions from the bounding scaling equations and it is shown that the retarded Hamaker constants derived from approximate Lifshitz theory underestimate the critical thickness of foam and emulsion films. The non-retarded Hamaker constant more adequately bounds the critical thickness measurements over the entire range of film radii reported in the literature. This result reinforces observations made by other independent researchers that interfacial interactions in flexible liquid films are not adequately represented by the retarded Hamaker constant obtained from Lifshitz theory and that the interactions become significant at much greater separations than previously thought. |
Keywords | thin films, thinning velocity, critical film thickness, spontaneous rupture mechanism, scaling laws, Lifshitz theory |
ANZSRC Field of Research 2020 | 400499. Chemical engineering not elsewhere classified |
Public Notes | File reproduced in accordance with the copyright policy of the publisher/author. |
Byline Affiliations | Los Alamos National Laboratory, United States |
University of Queensland | |
Department of Mechanical and Mechatronic Engineering |
https://research.usq.edu.au/item/9x865/scaling-laws-for-the-critical-rupture-thickness-of-common-thin-films
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