Integrating the impact of wheat fungal diseases in the Belgian crop yield forecasting system (B-CYFS)
Article
Article Title | Integrating the impact of wheat fungal diseases in the Belgian crop yield forecasting system (B-CYFS) |
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ERA Journal ID | 5307 |
Article Category | Article |
Authors | El Jarroudi, Moussa (Author), Kouadio, Louis (Author), Bertrand, Martin (Author), Curnel, Yannick (Author), Giraud, Frederic (Author), Delfosse, Philippe (Author), Hoffmann, Lucien (Author), Oger, Robert (Author) and Tychon, Bernard (Author) |
Journal Title | European Journal of Agronomy |
Journal Citation | 40, pp. 8-17 |
Number of Pages | 10 |
Year | 2012 |
Publisher | Elsevier |
Place of Publication | Netherlands |
ISSN | 1161-0301 |
1873-7331 | |
Digital Object Identifier (DOI) | https://doi.org/10.1016/j.eja.2012.02.003 |
Web Address (URL) | http://www.sciencedirect.com/science/article/pii/S1161030112000251 |
Abstract | Field experiments were conducted over four growing seasons to assess the relationship between fungal disease attacks and wheat grain yield in the agrometeorological part of the Belgian crop yield forecasting system (i.e., Belgian crop growth monitoring system, B-CGMS) by recalibrating the lifespan of wheat leaves (SPAN parameter). The results from 133 experimental fields in Belgium (the Wallonia region) and the Grand-Duchy of Luxembourg were analyzed in terms of site factors such as cultivar, previous crop, sowing date and geographical area. A significant relationship was found between green leaf area (GLA) duration expressing the infection pressure (parameter m; using a modified Gompertz model and calculated from observed GLA) and final grain yield (R2=0.79; P<0.001). Based on this relationship and by recalibrating the B-CGMS in terms of its SPAN parameter, there was a significant improvement in estimating final grain yield. From a R2 of 0.11 when the B-CGMS was run with the default SPAN value, the relationship between observed and simulated yields was strengthened, with a R2 of 0.47 and 0.57, respectively, when a linear or quadratic relationship was considered between m and SPAN. Although, from a practical point of view, the m value has to be estimated annually for each spatial grid or group of grids on the basis of field or possibly remotely sensed data, and although estimating this parameter is possible only late in the season, these encouraging results illustrate the potential of integrating pest and disease impact in the B-CGMS. |
Keywords | yield forecasting; B-CGMS; SPAN parameter; fungal disease; leaf senescence |
Contains Sensitive Content | Does not contain sensitive content |
ANZSRC Field of Research 2020 | 300207. Agricultural systems analysis and modelling |
310705. Mycology | |
300409. Crop and pasture protection (incl. pests, diseases and weeds) | |
Public Notes | Files associated with this item cannot be displayed due to copyright restrictions. |
Byline Affiliations | University of Liege, Belgium |
Wallon Centre for Agronomic Research, Belgium | |
Staphyt, France | |
Luxembourg Institute of Science and Technology, Luxembourg | |
Institution of Origin | University of Southern Queensland |
https://research.usq.edu.au/item/q2qxy/integrating-the-impact-of-wheat-fungal-diseases-in-the-belgian-crop-yield-forecasting-system-b-cyfs
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