The effect of strain on the electrical conductance of p-type nanocrystalline silicon carbide thin films
Article
Article Title | The effect of strain on the electrical conductance of p-type nanocrystalline silicon carbide thin films |
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ERA Journal ID | 201060 |
Article Category | Article |
Authors | Phan, Hoang-Phuong (Author), Dao, Dzung Viet (Author), Wang, Li (Author), Dinh, Toan (Author), Nguyen, Nam-Trung (Author), Qamar, Afzaal (Author), Tanner, Philip (Author), Dimitrijev, Sima (Author) and Zhu, Yong (Author) |
Journal Title | Journal of Materials Chemistry C |
Journal Citation | 3 (6), pp. 1172-1176 |
Number of Pages | 5 |
Year | 2015 |
Publisher | The Royal Society of Chemistry |
Place of Publication | United Kingdom |
ISSN | 2050-7526 |
2050-7534 | |
Digital Object Identifier (DOI) | https://doi.org/10.1039/c4tc02679a |
Web Address (URL) | https://pubs.rsc.org/en/content/articlelanding/2015/tc/c4tc02679a |
Abstract | This paper presents for the first time the effect of strain on the electrical conductance of p-type nanocrystalline SiC grown on a Si substrate. The gauge factor of the p-type nanocrystalline SiC was found to be 14.5 which is one order of magnitude larger than that in most metals. This result indicates that mechanical strain has a significant influence on the electrical conductance of p-type nanocrystalline SiC, which is promising for mechanical sensing applications in harsh environments. |
ANZSRC Field of Research 2020 | 401705. Microelectromechanical systems (MEMS) |
Public Notes | Files associated with this item cannot be displayed due to copyright restrictions. |
Byline Affiliations | Griffith University |
Institution of Origin | University of Southern Queensland |
https://research.usq.edu.au/item/q5q5y/the-effect-of-strain-on-the-electrical-conductance-of-p-type-nanocrystalline-silicon-carbide-thin-films
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